Rapid-Rate Thermal Cycle Chamber
High temperature rate of change with uniformity and reproducibility
The Rapid-Rate Thermal Cycle Chamber is ideal for test requiring quick changes 15°C/min ramp rate in specimen temperature and 23°C/min ramp rate for air temperature. It covers various applications from JEDEC, IEC standards to screening.
It features new technologies, such as a specimen temperature control function maintaining linear specimen temperature change rates during rapid thermal cycling, and temperature ramp control.
Compatible Test standards
IEC-60749-25 : Semiconductor devices – Temperature cycling
IEC-60068-2-14 Nb : Environmental testing – Change of temperature
IEC-61147-5 : Liquid crystal and solid-state display devices – Environmental, endurance and mechanical test methods
JESD22-A105-B : Solid State Devices, testing quality and reliability – Power and temperature cycling
SAE-J1211 : Automotive components - Recommended environmental practices for electronic equipment design
IPC-9701 : Performance test methods and qualification requirements for surface mount solder attachments